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dc.contributor.authorMorris, Alan S.en_us
dc.contributor.authorLangari, Rezaen_us
dc.date.accessioned2025-04-21T01:55:24Z
dc.date.available2025-04-21T01:55:24Z
dc.date.issued2021en_us
dc.identifier.isbn9780128171417en_us
dc.identifier.otherHPU2166457en_us
dc.identifier.urihttps://lib.hpu.edu.vn/handle/123456789/35699
dc.description.abstractThe first edition of this current text then followed in 2011. In developing this, the opportunity was taken to strengthen the book by bringing in a second author, Professor Reza Langari of Texas AandM University, who has made significant contributions especially in the areas of data acquisition and signal processing and the implementation of these using industry-standard LabView software. As well as this new contribution by Professor Langari, this edition covered many new developments in the field of measurement. In particular, it covered the significant recent advances that there have been in smart sensors, intelligent instruments, microsensors, data acquisition, digital signal processing, digital recorders, digital fieldbuses, and new methods of signal transmission. The rapid growth of digital components within measurement systems also created a need to establish procedures in the book for measuring and improving the reliability of the software that is used within such components. Formal standards governing instrument calibration procedures and measurement system performance were extended beyond the traditional area of quality assurance systems (International Organization for Standardization [ISO]9000) into new areas such as environmental protection systems (ISO14000). Thus, when published in 2011, the book was reasonably up-to-date with all of the recent developments in measurement systems up to that time.en_us
dc.format.extent711 p.en_us
dc.format.mimetypeapplication/pdf
dc.language.isoenen_us
dc.publisherAcademic Pressen_us
dc.subjectMeasurement techniquesen_us
dc.subjectMeasurement systemsen_us
dc.subjectInduced measurementen_us
dc.titleMeasurement and Instrumentation: Theory and Application, Third Editionen_us
dc.typeBooken_us
dc.size29.8 MBen_us
dc.departmentTechnologyen_us


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