Please use this identifier to cite or link to this item: https://lib.hpu.edu.vn/handle/123456789/29817
Title: Nano-CMOS gate dielectric engineering
Authors: Wong, Hei
Keywords: Nano-CMOS
Nano
Nano technologies
Issue Date: 2012
Publisher: CRC Press
Abstract: Content: Machine generated contents note: 1.Overview of CMOS Technology. 1.1.Introduction. 1.2.MOS Transistor: A Quick Introduction to Classical Models. 1.2.1.Current-Voltage Characteristics. 1.2.2.Threshold Voltage. 1.3.Short-Channel Effects and Short-Channel Modifications. 1.3.1.Effect on I-V Characteristics. 1.3.2.Subthreshold Conduction. 1.3.3.Short-Channel Effects. 1.3.3.Threshold Voltage Roll-Off. 1.3.4.Drain-Induced Barrier Lowering (DIBL). 1.3.5.Gate Leakage Current. 1.3.5.1.Direct-Tunneling. 1.3.5.2.Fowler-Nordheim Tunneling. 1.3.5.3.Poole-Frenkel Emission and Trap-Assisted Tunneling. 1.4.Features and Uniqueness of MOS Transistor. 1.5.MOS in Deca-Nanometer.
URI: https://lib.hpu.edu.vn/handle/123456789/29817
ISBN: 9781439849590
1439849595
Appears in Collections:Technology

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