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dc.contributor.authorHenno, J.en_US
dc.contributor.authorKiyoki, H. Jaakkola Y.en_US
dc.date.accessioned2019-03-19T08:32:48Z
dc.date.available2019-03-19T08:32:48Z
dc.date.issued2006en_US
dc.identifier.isbn9781586035914en_US
dc.identifier.isbn1-58603-591-6en_US
dc.identifier.otherHPU1161191en_US
dc.identifier.urihttps://lib.hpu.edu.vn/handle/123456789/32262
dc.description.abstractCurrently, the structural complexity of information resources, the variety of abstraction levels of information, and the size of databases and knowledge bases are continuously growing. We are facing the complex problems of structuring, sharing, managing, searching and mining data and knowledge from a large amount of complex information resources existing in databases and knowledge bases. New methodologies in many areas of information modelling and knowledge bases are expected to provide sophisticated and reliable solutions to these problems. The aim of this series of Information Modelling and Knowledge Bases is to provide research communities in information modelling and knowledge bases with scientific results and experiences achieved by using innovative methodologies in computer science and other disciplines related to linguistics, philosophy, and psychology. The selected papers cover many areas of information modelling, concept theories, database semantics, knowledge bases and systems, software engineering, WWW information managements, context-based information access spaces, ontological technology, image databases, temporal and spatial databases, document data managements, and many more. IOS Press is an international science, technical and medical publisher of high-quality books for academics, scientists, and professionals in all fields.en_US
dc.format.extent352 p.en_US
dc.format.mimetypeapplication/pdf
dc.language.isoenen_US
dc.publisherIOS Pressen_US
dc.subjectArtificial Intelligenceen_US
dc.subjectTechnologyen_US
dc.subjectKnowledge Basesen_US
dc.subjectComputersen_US
dc.titleInformation Modelling and Knowledge Bases XVIIen_US
dc.typeBooken_US
dc.size7,966 KBen_US
dc.departmentTechnologyen_US


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