Outlook and Challenges of Nano Devices, Sensors, and MEMS

dc.contributor.editor	Li, Ting	en_US
dc.contributor.editor	Liu, Ziv	en_US
dc.date.accessioned	2018-04-24T02:52:15Z
dc.date.available	2018-04-24T02:52:15Z
dc.date.issued	2017	en_US
dc.identifier.isbn	978-3-319-50822-1	en_US
dc.identifier.isbn	978-3-319-50824-5	en_US
dc.identifier.other	HPU1160722	en_US
dc.identifier.uri	https://lib.hpu.edu.vn/handle/123456789/30449
dc.description.abstract	This book provides readers with an overview of the design, fabrication, simulation, and reliability of nanoscale semiconductor devices, MEMS, and sensors, as they serve for realizing the next-generation internet of things. The authors focus on how the nanoscale structures interact with the electrical and/or optical performance, how to find optimal solutions to achieve the best outcome, how these apparatus can be designed via models and simulations, how to improve reliability, and what are the possible challenges and roadblocks moving forward.	en_US
dc.format.extent	522 p.	en_US
dc.format.mimetype	application/pdf	en_US
dc.language.iso	en	en_US
dc.publisher	Springer International Publishing	en_US
dc.subject	Circuits and systems	en_US
dc.subject	Electronic circuits and devices	en_US
dc.subject	Nano	en_US
dc.subject	MEMS	en_US
dc.title	Outlook and Challenges of Nano Devices, Sensors, and MEMS	en_US
dc.type	Book	en_US
dc.size	28,652 KB	en_US
dc.department	Technology	en_US