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dc.contributor.editorThomas, Sabuen_US
dc.date.accessioned2018-04-24T02:51:43Z
dc.date.available2018-04-24T02:51:43Z
dc.date.issued2017en_US
dc.identifier.isbn9780323461474en_US
dc.identifier.isbn9780323461412en_US
dc.identifier.otherHPU1160692en_US
dc.identifier.urihttps://lib.hpu.edu.vn/handle/123456789/30417
dc.description.abstractMicroscopy Methods in Nanomaterials Characterization fills an important gap in the literature with a detailed look at microscopic and X-ray based characterization of nanomaterials. These microscopic techniques are used for the determination of surface morphology and the dispersion characteristics of nanomaterials. This book deals with the detailed discussion of these aspects, and will provide the reader with a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc. In addition, it covers the latest developments and trends morphological characterization using a variety of microscopes. Materials scientists, materials engineers and scientists in related disciplines, including chemistry and physics, will find this to be a detailed, method-orientated guide to microscopy methods of nanocharacterization.en_US
dc.format.extent432 p.en_US
dc.format.mimetypeapplication/pdfen_US
dc.language.isoenen_US
dc.publisherElsevieren_US
dc.subjectNano technologiesen_US
dc.subjectMicroscopy methodsen_US
dc.subjectNanomaterials characterizationen_US
dc.titleMicroscopy Methods in Nanomaterials Characterization. A volume in Micro and Nano Technologies, 1st editionen_US
dc.typeBooken_US
dc.size32,277 KBen_US
dc.departmentTechnologyen_US


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