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dc.date.accessioned2018-03-27T02:52:55Z
dc.date.available2018-03-27T02:52:55Z
dc.date.issued2014en_US
dc.identifier.isbn9780000021281en_US
dc.identifier.isbn0000021288en_US
dc.identifier.otherHPU1160601en_US
dc.identifier.urihttps://lib.hpu.edu.vn/handle/123456789/29908
dc.description.abstractSilicene is becoming one of the most important two-dimensional materials. In this work, EEL Spectra were calculated for α-silicene (flat), and β-silicene (low-buckled, and theoretically the most stable). Band structures were determined using the semi-empirical Tight-Binding Method considering second nearest neighbors, sp3 model, Harrison's rule, and Slater-Koster parameterization. The dielectric function was calculated within the Random Phase Approximation and a space discretization scheme. We found that, compared to bulk Si, additional resonances appear which are red-shifted. Buckling gives rise to a richer structure at low energy.en_US
dc.format.extent171 p.en_US
dc.format.mimetypeapplication/pdfen_US
dc.language.isoenen_US
dc.publisherTTPen_US
dc.subjectJournalen_US
dc.subjectNano researchen_US
dc.subjectTechniqueen_US
dc.titleJournal of nano research. Volume 28en_US
dc.typeArticleen_US
dc.size17,457 KBen_US
dc.departmentTechnologyen_US


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