Please use this identifier to cite or link to this item:
https://lib.hpu.edu.vn/handle/123456789/30978
Title: | Nanocharacterisation |
Authors: | Kirkland, Angus I. Haigh, Sarah J. |
Keywords: | Nanocharacterisation Technology Nano |
Issue Date: | 2015 |
Publisher: | Royal Society of Chemistry |
Abstract: | Nanocharacterisation provides an overview of the main characterisation techniques that are currently used to study nanostructured materials. Following on from the success of the first edition, this new edition has been fully revised and updated to reflect the recent developments in instrumental characterisation methods. With contributions from internationally recognised experts, each chapter focuses on a different technique to characterise nanomaterials providing experimental procedures and applications. State of the art characterisation methods covered include Transmission Electron Microscopy, Scanning Transmission Electron Microscopy, Scanning Probe Microscopy, Electron Energy Loss Spectroscopy and Energy Dispersive X-ray Analysis, 3D Characterisation, Scanning Electron and Ion Microscopy and In situ Microscopy. Essentially a handbook to all working in the field this indispensable resource will appeal to academics, professionals and anyone working fields related to the research and development of nanocharacterisation and nanotechnology. |
URI: | https://lib.hpu.edu.vn/handle/123456789/30978 |
ISBN: | 9781782621867 1782621865 |
Appears in Collections: | Technology |
Files in This Item:
File | Description | Size | Format | |
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Nanocharacterisation-803.pdf Restricted Access | 25.27 MB | Adobe PDF | View/Open Request a copy |
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