Please use this identifier to cite or link to this item:
https://lib.hpu.edu.vn/handle/123456789/30417
Title: | Microscopy Methods in Nanomaterials Characterization. A volume in Micro and Nano Technologies, 1st edition |
Authors: | Thomas, Sabu |
Keywords: | Nano technologies Microscopy methods Nanomaterials characterization |
Issue Date: | 2017 |
Publisher: | Elsevier |
Abstract: | Microscopy Methods in Nanomaterials Characterization fills an important gap in the literature with a detailed look at microscopic and X-ray based characterization of nanomaterials. These microscopic techniques are used for the determination of surface morphology and the dispersion characteristics of nanomaterials. This book deals with the detailed discussion of these aspects, and will provide the reader with a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc. In addition, it covers the latest developments and trends morphological characterization using a variety of microscopes. Materials scientists, materials engineers and scientists in related disciplines, including chemistry and physics, will find this to be a detailed, method-orientated guide to microscopy methods of nanocharacterization. |
URI: | https://lib.hpu.edu.vn/handle/123456789/30417 |
ISBN: | 9780323461474 9780323461412 |
Appears in Collections: | Technology |
Files in This Item:
File | Description | Size | Format | |
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Microscopy-Methods-in-Nanomaterials-Characterization-716.pdf Restricted Access | 32.28 MB | Adobe PDF | View/Open Request a copy |
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