Please use this identifier to cite or link to this item: http://lib.hpu.edu.vn/handle/123456789/21405
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dc.contributor.authorBienkowski, Pawelen_US
dc.contributor.authorTrzaska, Huberten_US
dc.date.accessioned2016-06-13T03:07:21Z
dc.date.available2016-06-13T03:07:21Z
dc.date.issued2011en_US
dc.identifier.isbn9781891121067en_US
dc.identifier.otherHPU2160090en_US
dc.identifier.urihttps://lib.hpu.edu.vn/handle/123456789/21405-
dc.description.abstractThis book is devoted to the specific problems of electromagnetic field (EMF) measurements in the near field and to the analysis of the main factors which impede accuracy in these measurements. It focuses on careful and accurate design of systems to measure in the near field based on a thorough understanding of the fundamental engineering principles and on an analysis of the likely system errors. Beginning with a short introduction to electromagnetic fields with an emphasis on the near field, it them presents methods of EMF measurements in near field conditions. It details the factors limiting measurement accuracy including internal ones (thermal stability, frequency response, dynamic characteristics, susceptibility) and external ones (field integration, mutual couplings between a probe and primary and secondary EMF sources, directional pattern deformations). It continues with a discussion on how to gauge the parameters declared by an EMF meter manufacturer and simple methods for testing these parameters. It also details how designers of measuring equipment can reconsider the near field when designing and testing, as well as how users can exploit the knowledge within the book to ensure their tests and results contain the most accurate measurements possible. Electromagnetic Measurements in the Near Field is addressed to a wide range of specialists in biology, medicine, labor safety, environmental protection, metrologists, EMF meter designers, testers and users, and even for those who must make legal decisions on the grounds of measurement results interpretation.en_US
dc.format.extent232 p.en_US
dc.format.mimetypeapplication/pdf-
dc.language.isoenen_US
dc.publisherSciTech Publishingen_US
dc.relation.ispartofseriesSciTech Series on Electromagnetic Compatibilityen_US
dc.subjectElectromagnetic measurementsen_US
dc.subjectNear fielden_US
dc.subjectElectromagnetic fieldsen_US
dc.titleElectromagnetic Measurements in the Near Fielden_US
dc.typeBooken_US
dc.size2.14 MBen_US
dc.departmentEnglish resourcesen_US
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