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dc.contributor.editorKirkland, Angus I.en_us
dc.contributor.editorHaigh, Sarah J.en_us
dc.date.accessioned2018-05-23T09:47:47Z
dc.date.available2018-05-23T09:47:47Z
dc.date.issued2015en_us
dc.identifier.isbn9781782621867en_us
dc.identifier.isbn1782621865en_us
dc.identifier.otherHPU1160741en_us
dc.identifier.urihttp://lib.hpu.edu.vn/handle/123456789/30978
dc.description.abstractNanocharacterisation provides an overview of the main characterisation techniques that are currently used to study nanostructured materials. Following on from the success of the first edition, this new edition has been fully revised and updated to reflect the recent developments in instrumental characterisation methods. With contributions from internationally recognised experts, each chapter focuses on a different technique to characterise nanomaterials providing experimental procedures and applications. State of the art characterisation methods covered include Transmission Electron Microscopy, Scanning Transmission Electron Microscopy, Scanning Probe Microscopy, Electron Energy Loss Spectroscopy and Energy Dispersive X-ray Analysis, 3D Characterisation, Scanning Electron and Ion Microscopy and In situ Microscopy. Essentially a handbook to all working in the field this indispensable resource will appeal to academics, professionals and anyone working fields related to the research and development of nanocharacterisation and nanotechnology.en_us
dc.format.extent358 p.en_us
dc.format.mimetypeapplication/pdf
dc.language.isoenen_us
dc.publisherRoyal Society of Chemistryen_us
dc.subjectNanocharacterisationen_us
dc.subjectTechnologyen_us
dc.subjectNanoen_us
dc.titleNanocharacterisationen_us
dc.typeBooken_us
dc.size25,266 KBen_us
dc.departmentTechnologyen_us


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